SPEAKER PROFILE |
 Dr. Andreas J. Huber neaspec GmbH Germany |
Nanoscale characterization of organic and inorganic materials
by IR & THz near-field imaging and spectroscopy
Abstract
Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) enables to overcome the diffraction limit of light of conventional optical measurements and to achieve a spatial resolution below 20 nanometers for optical imaging and spectroscopy
Recently, the combined analysis of complex nanoscale material systems by correlating s-SNOM near-field optical data with information obtained by other SPM-based measurement methodologies has gained significant interest. For example, the material-characteristic s-SNOM imaging of a phase-separated PS/LDPE polymer blend verified a sharp material interface for the materials simultaneously to a strong change of mechanical properties like adhesion. Further, results will be presented that correlate the near-field optical response of functional SRAM devices (3D) in different frequency ranges (mid-IR & THz) to Kelvin Probe Force Microscopy (KPFM) measurements.
Thus, neaspec’s neaSNOM s-SNOM systems represent an ideal platform to characterize complex material systems by different near-field and AFM-based methods at the nanoscale.
He then joined the group of Prof. Rainer Hillenbrand at the Max-Planck-Institute of Biochemistry for his PhD project to work on infrared near-field microscopy.
In 2009 he started to work for neaspec, now as Director Sales & Applications Development.
Since the very beginning of his scientific work Andy was focused on near-field microscopy and spectroscopy applications in wide spectral range from visible to infrared wavelengths, with special focus on the THz frequency range.
Recently, the combined analysis of complex nanoscale material systems by correlating s-SNOM near-field optical data with information obtained by other SPM-based measurement methodologies has gained significant interest. For example, the material-characteristic s-SNOM imaging of a phase-separated PS/LDPE polymer blend verified a sharp material interface for the materials simultaneously to a strong change of mechanical properties like adhesion. Further, results will be presented that correlate the near-field optical response of functional SRAM devices (3D) in different frequency ranges (mid-IR & THz) to Kelvin Probe Force Microscopy (KPFM) measurements.
Thus, neaspec’s neaSNOM s-SNOM systems represent an ideal platform to characterize complex material systems by different near-field and AFM-based methods at the nanoscale.
Bio
Andy graduated in Physics from TU Munich, Germany, in 2005.He then joined the group of Prof. Rainer Hillenbrand at the Max-Planck-Institute of Biochemistry for his PhD project to work on infrared near-field microscopy.
In 2009 he started to work for neaspec, now as Director Sales & Applications Development.
Since the very beginning of his scientific work Andy was focused on near-field microscopy and spectroscopy applications in wide spectral range from visible to infrared wavelengths, with special focus on the THz frequency range.