Dr. Andreas J. Huber
neaspec GmbH


Nanoscale characterization of organic and inorganic materials
by IR & THz near-field imaging and spectroscopy


Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) enables to overcome the diffraction limit of light of conventional optical measurements and to achieve a spatial resolution below 20 nanometers for optical imaging and spectroscopy

Recently, the combined analysis of complex nanoscale material systems by correlating s-SNOM near-field optical data with information obtained by other SPM-based measurement methodologies has gained significant interest. For example, the material-characteristic s-SNOM imaging of a phase-separated PS/LDPE polymer blend verified a sharp material interface for the materials simultaneously to a strong change of mechanical properties like adhesion. Further, results will be presented that correlate the near-field optical response of functional SRAM devices (3D) in different frequency ranges (mid-IR & THz) to Kelvin Probe Force Microscopy (KPFM) measurements.

Thus, neaspecís neaSNOM s-SNOM systems represent an ideal platform to characterize complex material systems by different near-field and AFM-based methods at the nanoscale.


Andy graduated in Physics from TU Munich, Germany, in 2005.

He then joined the group of Prof. Rainer Hillenbrand at the Max-Planck-Institute of Biochemistry for his PhD project to work on infrared near-field microscopy.

In 2009 he started to work for neaspec, now as Director Sales & Applications Development.

Since the very beginning of his scientific work Andy was focused on near-field microscopy and spectroscopy applications in wide spectral range from visible to infrared wavelengths, with special focus on the THz frequency range.