Characterization and understanding of the changes of a sample due to a mechanical, electromagnetic, chemical, or light action, or associated with change of the environmental temperature, pressure, or humidity necessitate a fast and real time 3D topography measurement system.

Most of profilometers perform a lateral or a vertical scanning for retrieving the 3D topography of samples. Such technical constraint prevent to measure time-sequences of 3D topographies with a sufficient time resolution. DHM® are non-scanning measurement systems providing time sequences of 3D topography with an unrivaled time resolution, both in term of acquisition rate and acquisition time. Principle of measurement, specifications, and application examples will be presented.

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Bio

Yves Emery, born in 1966, graduated in Physics at Swiss Federal Institute of Technology of Lausanne (EPFL), hold a PhD in Physics from the Group of Applied Physics (GAP) of the University of Geneva, and a Business Administration Postgraduate certificate of the University of Lausanne (HEC-UNIL). He made his postdoctoral studies at Texas A&M University. His main fields of research are optics and lasers applied to medical, environment sensing, and metrology. He is the author or co-author of over 60 articles published in peer reviewed journals and of three patents.

Back in Switzerland, he worked five years as Director of R&D and production in two start-up active in the medical device field. In 2002, he joined the group of founders, brought its experience and network to valorize the DHM® technology and is presently CEO of Lyncée Tec SA. He has been honored by several industrial prizes for is work with Lyncée Tec SA, including the De Vigier Price 2004. In 2015, Lyncée is present in more than 40 countries.